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Courses » Material Characterization

Material Characterization

ABOUT THE COURSE:

It is the first course at the under graduate level on microstructural characterization of materials. This course will cover the basic principles and techniques of X-ray diffraction, optical, scanning electron and transmission electron microscopy along with demonstrations of the instrument details and imaging experiments through videos.  This course also deals with the sample preparation techniques for the microstructural analysis with practical examples through videos.

INTENDED AUDIENCE:

Undergraduate students of Metallurgical and Materials, Physics, Chemistry and biological sciences

PRE-REQUISITES: N/A

INDUSTRY SUPPORT:

All the Metallurgical and automotive industries will be interested in this course

817 students have enrolled already!!

COURSE INSTRUCTOR:


Dr. S. Sankaran is presently an Associate Professor in the department of Metallurgical and Materials Engineering, IIT Madras. His research interests are deformation processing of materials, mechanical behavior of materials and electron microscopy. He is also presently the faculty in-charge of central electron microscopy of IIT Madras.

COURSE LAYOUT:

Week 1
1. Fundamentals of optics
2. Optical microscope and its instrumental details

Week 2
3. Variants in the optical microscopes and image formation
4. Phase contrast, Polarised light, Differential interference contrast, Fluorescence microscopy

Week 3
5. Sample preparation and applications of optical microscopes

Week 4
6. Introduction to Scanning electron microscopy (SEM)

Week 5
7. Instrumental details and image formation of SEM

Week 6
8. Various imaging techniques and spectroscopy
9. Sample preparation and applications of SEM

Week 7
10. Fundamentals of X-ray scattering
11. Bragg’s law derivation and the factors affecting the intensity

Week 8
12. Crystallite size, effect of strain on the intensity
13. Profile fit, indexing, peak broadening

Week 9
14. Quantitative analysis, residual stress analysis
15. Instrumentation details and demo experiments of XRD

Week 10
16. Introduction to transmission electron microscopy (TEM)

Week 11
17. Diffraction and image formation
18. Various imaging techniques and spectroscopy

Week 12
19. Sample preparation and applications of TEM
20. Instrumentation details and demo experiments of TEM

REFERENCE MATERIALS / BOOKS:
1) ‘Fundamentals of light microscopy and electronic imaging’  Douglas B. Murphy, 2001, Wiley-Liss, Inc. USA
2) ‘Encyclopedia of Materials Characterization, Surfaces, Interfaces, Thin Films,’ Editors  C. Richard Brundle, Charles A. Evans, Jr., Shaun Wilson, Butterworth-Heinemann, Boston, US
3) ‘Elements of X-ray diffraction’ B.D. Cullity and S.R. Stock, 2001, Prentice Hall, Inc. USA
4) ‘Transmission electron microscopy” D.B. Williams and C. Barry Carter, 4 volumes, Springer, 1996. USA

CERTIFICATION EXAM:
  • The exam is optional for a fee.
  • Date and Time of Exams: April 28 (Saturday) and April 29 (Sunday) : Morning session 9am to 12 noon; 
  • Exam for this course will be available in one session on both 28 and 29 April. 
  • Registration url: Announcements will be made when the registration form is open for registrations.
  • The online registration form has to be filled and the certification exam fee needs to be paid. More details will be made available when the exam registration form is published.
CERTIFICATE:
  • Final score will be calculated as : 25% assignment score + 75% final exam score
  • 25% assignment score is calculated as 25% of average of 12 weeks course: Best 8 out of 12 assignments
  • E-Certificate will be given to those who register and write the exam and score greater than or equal to 40% final score. Certificate will have your name, photograph and the score in the final exam with the breakup. It will have the logos of NPTEL and Indian Institute of Technology, Madras. It will be e-verifiable at nptel.ac.in/noc.