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Courses » Materials Characterization

Materials Characterization

ABOUT THE COURSE
It is the first course at the under graduate level on microstructural characterization of materials. This course will cover the basic principles and techniques of X-ray diffraction, optical, scanning electron and transmission electron microscopy along with demonstrations of the instrument details and imaging experiments through videos.  This course also deals with the sample preparation techniques for the microstructural analysis with practical examples through videos.

INTENDED AUDIENCE

Undergraduate students of Metallurgical and Materials, Physics, Chemistry and biological sciences


PRE-REQUISITES
N/A

INDUSTRY SUPPORT – LIST OF COMPANIES/INDUSTRY THAT WILL RECOGNIZE/VALUE THIS ONLINE COURSE
All the Metallurgical and automotive industries will be interested in this course

737 students have enrolled already!!

COURSE INSTRUCTOR


Dr. S. Sankaran is presently an Associate Professor in the department of Metallurgical and Materials Engineering, IIT Madras. His research interests are deformation processing of materials, mechanical behavior of materials and electron microscopy. He is also presently the faculty in-charge of central electron microscopy of IIT Madras.
COURSE LAYOUT

Week 1

1. Fundamentals of optics

2. Optical microscope and its instrumental details

Week 2

3. Variants in the optical microscopes and image formation

4. Phase contrast, Polarised light, Differential interference contrast, Fluorescence microscopy

Week 3

5. Sample preparation and applications of optical microscopes

Week 4

6. Introduction to Scanning electron microscopy (SEM)

Week 5

7. Instrumental details and image formation of SEM

Week 6

8. Various imaging techniques and spectroscopy

9. Sample preparation and applications of SEM

Week 7

10. Fundamentals of X-ray scattering

11. Bragg’s law derivation and the factors affecting the intensity

Week 8

12. Crystallite size, effect of strain on the intensity

13. Profile fit, indexing, peak broadening

Week 9

14. Quantitative analysis, residual stress analysis

15. Instrumentation details and demo experiments of XRD

Week 10

16. Introduction to transmission electron microscopy (TEM)

Week 11

17. Diffraction and image formation

18. Various imaging techniques and spectroscopy

Week 12

19. Sample preparation and applications of TEM

20. Instrumentation details and demo experiments of TEM

LIST OF REFERENCE MATERIALS / BOOKS

1) ‘Fundamentals of light microscopy and electronic imaging’  Douglas B. Murphy, 2001, Wiley-Liss, Inc. USA

2) ‘Encyclopedia of Materials Characterization, Surfaces, Interfaces, Thin Films,’ Editors  C. Richard Brundle, Charles A. Evans, Jr., Shaun Wilson, Butterworth-Heinemann, Boston, USA

3) ‘Elements of X-ray diffraction’ B.D. Cullity and S.R. Stock, 2001, Prentice Hall, Inc. USA

4) ‘Transmission electron microscopy” D.B. Williams and C. Barry Carter, 4 volumes, Springer, 1996. USA


CERTIFICATION EXAM
  • The exam is optional for a fee. Exams will be held on 23 April 2017
  • Time: Shift 1: 9am-12 noon; Shift 2: 2pm-5pm
  • Any one shift can be chosen to write the exam for a course.
  • Registration URL: Announcements will be made when the registration form is open for registrations.
  • The online registration form has to be filled and the certification exam fee needs to be paid. More details will be made available when the exam registration form is published.

CERTIFICATE
  • Final score will be calculated as : 25% assignment score + 75% final exam score
  • 25% assignment score is calculated as 25% of average of best 8 out of 12 assignments
  • E-Certificate will be given to those who register and write the exam and score greater than or equal to 40% final score. Certificate will have your name, photograph and the score in the final exam with the breakup.It will have the logos of NPTEL and IIT Madras. It will be e-verifiable at nptel.ac.in/noc.