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Courses » Fundamentals of optical and scanning electron microscopy

Fundamentals of optical and scanning electron microscopy

ABOUT THE COURSE
 It is a first course at the under graduate level on microstructural characterization of materials. This course will cover the basic principles and techniques of optical and scanning electron microscopy along with demonstrations on the instrument details and imaging experiments through videos. This course also deals with the sample preparation techniques for the microstructural analysis with practical examples through videos.

INTENDED AUDIENCE
 Undergraduate students of Metallurgical and Materials, Physics, Chemistry and biological sciences

PRE-REQUISITES
 NIL

INDUSTRIES THAT WILL VALUE THIS
 All the Metallurgical and automotive industries will be interested in this course

1014 students have enrolled already!!

COURSE INSTRUCTOR


S.Sankaran is presently Associate Professor in the department of Metallurgical and Materials Engineering, IIT Madras. His research interests are deformation processing of materials, mechanical behavior of materials and electron microscopy. He is also presently the faculty in-charge of central electron microscopy of IIT Madras

Teaching Assistants                                                                                                                    
N. Maheswari, a Ph.D scholar, Department of metallurgical and materials engineering, IIT Madras. Area of research: Processing and characterization of quench and partitioned steels.

K Sai Rajeshwari, Integrated Masters and PhD, Department of metallurgical and materials engineering, IIT Madras. Area of research: Deformation processing and mechanical testing of Nickel base alloys
COURSE LAYOUT

 Module 1
1. Fundamentals of optics
 2. Optical microscope and its instrumental details
3. Variants in the optical microscopes and image formation

Module 2
4. Phase contrast, Polarised light, Differential interference contrast, Fluorescence microscopy
5. Sample preparation and applications

Module 3
6. Introduction to Scanning electron microscopy
7. Instrumental details and image formation

Module 4
8. Various imaging techniques and spectroscopy
9. Sample preparation and Applications      

Assignments

Total -8 assignments (1 per week).
Mostly MCQ, some subjective.
Best 5 will be taken for evaluation.

Certification Exam

The exam is optional.
Exams will be on 20 March 2016 and 27 March 2016.
Time: 2pm-5pm

Tentative list of exam cities: http://nptel.ac.in/noc/pdf/Exam%20City-list.pdf

Registration url: Announcements will be made when the registration form is open for registrations.

The online registration form has to be filled and the certification exam fee of approximately Rs 1000 needs to be paid.

Certificate

Certificate will be given to those who register and write the exam. Certificate will have your name, photograph and the score in the final exam.

It will have the logos of NPTEL and IIT Madras. It will be e-verifiable at nptel.ac.in/noc.


SUGGESTED READING

 ‘Fundamentals of light microscopy and electronic imaging’ Douglas B. Murphy, 2001, Wiley-Liss, Inc. USA
‘Encyclopedia of Materials Characterization, Surfaces, Interfaces, Thin Films,’ Editors C. Richard Brundle, Charles A. Evans, Jr., Shaun Wilson, Butterworth-Heinemann, Boston, USA